1. Product Information
MATS-2010M applies to measure the magnetic properties of silicon electric sheet: Ps, Jm, Hm, Ss and AC magnetizing curve and losses curve. It can also meet the special test requests: silicon steel, permalloy, amorphous alloy and nanocrystalline under 45Hz~1kHz or under 5kHz, and can also test over-shaped cores and applies to production line.
2. Applied Standards
GB/T 3655-2000 Methods of measurement of the magnetic properties of electrical steel sheet and strip by means of an Epstein frame
GB/T 13789-2008 Methods of measurement of the magnetic properties of magnetic sheet and strip by means of a single sheet tester
GB/T 3658-2008 Methods of measurement of a.c.magnetic properties of magnetically soft materials
IEC 60404-2 Methods of measurement of the magnetic properties of electrical steel sheet and strip by mesns of an Epstein frame
IEC 60404-3 Methods of measurement of the magnetic properties of magnetic sheet and strip by means of a single sheet tester
IEC 60404-6 Methods of measurement of a.c.magnetic properties of magnetically soft materials
3. Main Features
1. Adopted digital power source and A/D card instead of old analog power source, frequency meter, amperemeter, voltmeter and wattmeter.
2. Perfectly match Windows system, easy to operate.
3. Test Samples: hot&cold rolled silicon steel(oriented or non-oriented), permalloy, amorphous alloy and nanocrystalline.
4. Sample shape: ribbon and chip open samples, ring, E&U shape etc closed-circuit samples.
5. Open circuit samples adopt Epstein Square to form closed magnetic circuit, it can also select permeameter. Closing sample can be put under direct winding measurement, finished transformer can be also put under direct measurement.
6. A non-load transformer included a sample core, a magnetizing turns(N1) and a measuring turns(N2).
7. N1 connected non-inductive resistance, to define the magnetizing current by testing the descending voltage of the non-inductive resistance to get the field strength. Peak value lock feedback by digits, field lock accuracy is 0.5%.
8. Get flux induction by digital analyzing the N2 voltage,Peak value lock feedback by digits, induction lock accuracy is 0.2%.
9. Power source and sampling amplifier embedded in one case with simple interfaces: a computer-connect inferface RS232, two-way voltage signal connect to A/D card.
10. Use voltammetry and DDA to test magnetic property like dynamic hysteresis loop, Ps, Jm, Hm, Ss, μa, loss angle, Br and Hc.
11. Constantly test over 255 points, each one cost 30 seconds, fixed frequency, lock Bm or lock Hm modes optional.
4. Software Function
1. Perfectly match Windows 7. English & English-Chinese version optional. Easy to operate.
2. Lock Bm or Lock Hm oprtioal, multiple choices.
3. Full-automatic operation. Intelligent auto-recognition.
4. Measuring process in real time monitoring, can be suspended at any time.
5. Automatic calculating. Be able to do results conversion according to temperature.
6. Adopted data base format, directly print or output test results to Excel.
7. Document function: data save, data delete, remove whole data etc.
8. Reports include full sample data, sample parameters, device parameters and test schemes. Text format, easy to output.
9. Display I(t), U(t), B(t)curves and B(H) hysteresis loop. Coordinates of each points on the curves canbe also displayed.
10. After multiple points clustering, display B(H) hysteresis loop cluster, B(H) magnetizing curve, μa(H) curve and Ps(B) loss curve. Coordinates of each points on the curves canbe also displayed.
11. Set B(H) magnetizing curve and Ps(B) together on one chart, easy to analysis.
12. Set limits according to μa, Ps, Bm, Br, Hc and Hm. Define and color the passed results.
13. Support various kinds of printers. Test reports perfectly match the print sheet.
14. Print preview, easy to adjust the reports size and edge.
15. Print reports directly or convert the report to graphic file JPG.
16. Built-in e-mail sending function.
17. Test reports include full curve graphic, test results, test conditions and sample parameters. Chinese & English version alterable, able to add clients information.
7. Technical Data
1. According to GB/T 3655-2000,under 50Hz. 60Hz., test 30×300mm silicon steel by 25cm Epstein frame, reports as following:
| Parameters |
Ps(%) |
Ss(%) |
Hrms(%) |
Bm(%) |
Hm(%) |
| Uncertainty(k=2) |
1 |
1 |
2 |
1 |
2 |
| Repeatability |
± 0.5 |
± 0.5 |
± 1 |
± 0.5 |
± 1 |
| Remarks |
Lock Bm: non oriented Bm≤1.5T
Oriented Bm≤1.7T |
Lock Hm:non orientedHm≥1000A/m
OrientedHm≥500A/m |
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2. According to GB/T 13789-2008,under 50Hz,60Hz,test 500×500mm silicon steel by SST-500 permeameter, reports as following:
| Parameters |
Ps(%) |
Ss(%) |
Hrms(%) |
Bm(%) |
Hm(%) |
| Uncertainty(k=2) |
1.5 |
1.5 |
2 |
1 |
3 |
| Repeatability |
± 0.5 |
± 0.5 |
± 1 |
± 0.5 |
± 1 |
| Remarks |
Lock Bm: non oriented Bm=0.8~1.5T
Oriented Bm=1.0~1.8T |
Lock Hm:non orientedHm≤10000A/m
OrientedHm≤1000A/m |
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3. According to GB/T 3658-2008,under 50Hz~1kHz,test permalloy, reports as following:
| Parameters |
Ps(%) |
Ss(%) |
Hrms(%) |
Bm(%) |
Hm(%) |
| Uncertainty(k=2) |
3 |
2 |
- |
1 |
3 |
| Repeatability |
± 1.5 |
± 1 |
± 1 |
± 0.5 |
± 0.5 |
| Remarks |
1. Samples should be thin ring, OD/ND<1.25.
2. Demagnetizing before testing and frequency of demagnetizing should be less than or equal to test frequency.
3. Uncertainty is "-", means there is no requirement in the National Standard. |
8. Hardware Parameters
| Technical Data |
MATS-2010M/K50 |
MATS-2010M/K75 |
MATS-2010M/10K |
| Max. Output Power |
500 VA sine wave |
750 VA sine wave |
500 VA sine wave |
| Frequency Range |
45 Hz ~ 1000 Hz |
400Hz~10kHz |
| Frequency Fineness |
1 Hz |
| Frequency Error |
< 0.05% |
| Output Voltage |
0~10V~50V~150V~300V |
0~10V~50V~80V~100V |
0~10V~50V~150V~300V |
| Voltage Fineness |
Program Control 1 mV, panel < 0.1%×current range |
| Voltage Distortion Factor |
Superior to 0.5% |
| Voltage Stability |
Superior to 0.02% |
| Sampling Current |
5mA~20A |
6.33mA~20A |
| Sampling Voltage |
100mV~400V |
1V~316V |
| Max. Voltage |
300V |
100V |
300V |
| Max. Current |
10A |
15A |
10A |
| Measurement materials |
hot rolling, cold rolling silicon steel materials, permalloy, amorphous and nm crystal. |
| Sample shape |
ribbon and chip open samples, toroid, E and U closing samples |
| Sample size |
For Epstein Frame : 30 mm x(280mm~ 300 mm)
For SST-500 Permeameter : 500mm x500mm
For customized Permeameter: decided by the Permeameter
For E and U closing samples , no physical limitation, size affects the max H field, |
| Accuracy (Ps) |
1% (50Hz, Epstein Frame) |
1.5% (50Hz, Permeameter) |
3%(10KHz, ring) |
| Test Time |
30s |
30s |
12s |
| Operating temperature |
23±5ºC |
| A/D Card |
PC6111 A/D Card |
PC6112 A/D Card |
PC6684 A/D Card |
| Sampling Rate |
/ |
/ |
40 MHz x 2 Channels |
| Convert time |
≤ 2.5μs(each channel) |
≤ 2.5μs(each channel) |
/ |
| Resolution and Linearity |
12 Bits ± 1 LSB |
16 Bits ± 1 LSB |
12 Bits ± 1/2 LSB |
| Voltage Range |
± 5 V ~± 10 V(full range) |
± 5 V ~± 10 V(full range) |
± 1 V (full range) |
| Sampling Clock |
6 μs ~ 10 ms
Hardware Clock |
6 μs ~ 10 ms
Hardware Clock |
25 ns ~ 800 ns
Hardware Clock |
| Internal Storage Capacity |
4 k Bytes |
4 k Bytes |
512 k Bytes x 2 |
| Bus Structure |
PCI busbar |
PCI busbar |
PCI busbar |
| Computer and Software |
Computer, LCD Monitor, printer, SMTest software(English) |
| Main cabinet |
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| Power supply |
220v 50/60Hz, 10A |
220v 50/60Hz,15A |
220v 50/60Hz,10A |
| Dimensions |
60 x49.5 x19cm |
60 x49.5 x19cm |
60 x49.5 x19cm |
9. Standard Configuration
| MATS-2010M/K50 |
MATS-2010M/K75 |
MATS-2010M/10K |
| MATS-2010M Hysteresisgraph |
MATS-2010M Hysteresisgraph |
MATS-2010M Hysteresisgraph |
| PC6111 A/D Card |
PC 6112 A/D Card |
PC 6684 A/D Card |
| Measurement Software |
Measurement Software |
Measurement Software |
| Computer |
Computer |
Computer |
| Printer |
Printer |
Printer |
| Epstein Frame |
Epstein Frame |
Standard Specimen |
| Square Standard Specimen |
Square Standard Specimen |
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Remarks: 1. Above configuration is the reference for customers, final configuration in the contract shall prevail.
2. The desk in the picture is NOT included in the configuration.
3. The printer is optional accessory, without the printer, we can minus USD 200 of it from the price.
8. Accessory
ES-700 Epstein Frame
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Conforms to National GB/T3655-2000, and be used together with MATS-2010M Hysteresisgraph.
According to IEC404-2 Standards, ES-700 Epstein Frame is the basis of measuring the magnetic properties of electrical steel sheet and strip; from DC to audio frequency (10kHz), that is the total usage frequency range of electrical steel sheet. The measurement principle for DC magnetic properties is ballistic method and measurement principle for AC magnetic properties is voltammetry.
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| Item |
Description |
| Equivalent Magnetic Circuit |
940mm |
| Primary |
700 T |
| Secondary |
700 T |
| Sample Size |
30mm×(280~300mm) |
| Max. Sample Mass |
1kg |
| Frequency Range |
50Hz~1kHz |
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